Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer

Li Mei-Ya Wang Jing Liu Jun Yu Ben-Fang Guo Dong-Yun Zhao Xing-Zhong

Citation:

Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer

Li Mei-Ya, Wang Jing, Liu Jun, Yu Ben-Fang, Guo Dong-Yun, Zhao Xing-Zhong
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

  • Biaxially textured MgO templates were grown on un-textured metal substrates by inclined-substrate-deposition and YBa2Cu3O7-x films were epitaxially grown on these substrates by pulsed laser deposition. Yttria-stablized-zirconia and CeO2 were deposited in turn as buffer layers prior to YBa2Cu3O7-x growth. The biaxial alignment features of the films were examined by X-ray diffraction 2θ-scan,pole-figure,-scan and rocking curve of Ω angles. The Raman spectroscopy,scanning electron microscopy and atomic force microscopy were used to characterize the orientation order,morphology and surface roughness of the YBa2Cu3O7-x films,respectively. The influence of the thickness of CeO2 on the properties of the YBa2Cu3O7-x films were investigated and the singnificant and unique dependence of the properties of YBa2Cu3O7-x films on the thickness of CeO2 were revealed. The possible mechanisms for this dependence were discussed.
Metrics
  • Abstract views:  7774
  • PDF Downloads:  897
  • Cited By: 0
Publishing process
  • Received Date:  20 August 2007
  • Accepted Date:  02 November 2007
  • Published Online:  28 May 2008

/

返回文章
返回