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Mechanism and impact of the double-hump substrate current in high-voltage double diffused drain MOS transistors

Wang Jun Wang Lei Dong Ye-Min Zou Xin Shao Li Li Wen-Jun Steve Yang

Citation:

Mechanism and impact of the double-hump substrate current in high-voltage double diffused drain MOS transistors

Wang Jun, Wang Lei, Dong Ye-Min, Zou Xin, Shao Li, Li Wen-Jun, Steve Yang
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  • Abstract views:  12041
  • PDF Downloads:  2658
  • Cited By: 0
Publishing process
  • Received Date:  27 October 2007
  • Accepted Date:  28 December 2007
  • Published Online:  20 July 2008

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