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Investigation on surface damage phenomena induced by flashover across semiconductor

Zhao Wen-Bin Zhang Guan-Jun Yan Zhang

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Investigation on surface damage phenomena induced by flashover across semiconductor

Zhao Wen-Bin, Zhang Guan-Jun, Yan Zhang
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  • Abstract views:  8166
  • PDF Downloads:  851
  • Cited By: 0
Publishing process
  • Received Date:  11 September 2007
  • Accepted Date:  06 March 2008
  • Published Online:  05 April 2008

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