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Influence of pit defects on AlGaN surface and dislocation defects in GaN buffer layer on current collapse of AlGaN/GaN HEMTs

Xi Guang-Yi Ren Fan Hao Zhi-Biao Wang Lai Li Hong-Tao Jiang Yang Zhao Wei Han Yan-Jun Luo Yi

Citation:

Influence of pit defects on AlGaN surface and dislocation defects in GaN buffer layer on current collapse of AlGaN/GaN HEMTs

Xi Guang-Yi, Ren Fan, Hao Zhi-Biao, Wang Lai, Li Hong-Tao, Jiang Yang, Zhao Wei, Han Yan-Jun, Luo Yi
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  • Abstract views:  8239
  • PDF Downloads:  1726
  • Cited By: 0
Publishing process
  • Received Date:  24 January 2008
  • Accepted Date:  06 June 2008
  • Published Online:  20 November 2008

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