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Thickness dependent dislocation, electrical and optical properties in InN films grown by MOCVD

Zhang Zeng Zhang Rong Xie Zi-Li Liu Bin Xiu Xiang-Qian Li Yi Fu De-Yi Lu Hai Chen Peng Han Ping Zheng You-Dou Tang Chen-Guang Chen Yong-Hai Wang Zhan-Guo

Citation:

Thickness dependent dislocation, electrical and optical properties in InN films grown by MOCVD

Zhang Zeng, Zhang Rong, Xie Zi-Li, Liu Bin, Xiu Xiang-Qian, Li Yi, Fu De-Yi, Lu Hai, Chen Peng, Han Ping, Zheng You-Dou, Tang Chen-Guang, Chen Yong-Hai, Wang Zhan-Guo
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  • Abstract views:  7164
  • PDF Downloads:  1275
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Publishing process
  • Received Date:  03 November 2008
  • Accepted Date:  24 November 2008
  • Published Online:  20 May 2009

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