Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Total dose characteristics of single poly EEPROM and SONOS EEPROM on SOI

Xiao Zhi-Qiang Li Lei-Lei Zhang Bo Xu Jing Chen Zheng-Cai

Citation:

Total dose characteristics of single poly EEPROM and SONOS EEPROM on SOI

Xiao Zhi-Qiang, Li Lei-Lei, Zhang Bo, Xu Jing, Chen Zheng-Cai
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

  • Devices of single poly electrically ersable programmable read only memory (EEPROM) and silicon-oxide-nitride-oxide-silicon (SONOS) EEPROM on silicon on insulator (SOI) are fabricated on self-built 0.8 μm SOI process. And through a set of experiments on EEPROMs of these configurations and comparisons, SOI SONOS EEPROM is successfully developed with good and stable total dose radiation hardened characteristics. These provide stronger proofs to choose EEPROM in radiation hardened circuits.
    [1]

    Kuesters K H, Ludwig C, Mikolajick T, Nagel N, Specht M, Pissors V, Schulze N, Stein N, Willer J 2006 ICSICT'06. 8th International Conference on Solid-State and Integrated Circuit Technology Shanghai, Oct. 23—26 p740

    [2]

    Fang S H, Cheng X L, 2007 Chinese Journal of Electron Devices 30 1211 (in Chinese)[房少华、程秀兰 2007 电子器件 30 1211]

    [3]

    White M H, Adams D A, Bu J 2000 IEEE Circuit. Devic. 16 22

    [4]

    Takeuchi H, King T J 2003 IEEE Electr. Device Lett. 24 309

    [5]

    Wellekens D, Groeseneken G, Houdt J V, Maes H E 1993 IEEE Trans. Nuc. Sci. 40 1619

    [6]

    Cellere G, Pellati P, Chimerton A, Modelli A, Larcher L, PACSagrella A 2001 IEEE Trans. Nuc. Sci. 48 2222

    [7]

    Fang S H, Cheng X L, Huang Y, Gu H H 2007 Acta Phys. Sin. 56 6634(in Chinese)[房少华、程秀兰、黄 晔、顾怀怀 2007 物理学报 56 6634]

    [8]

    Guo H X, Chen Y S, Zhang Y M, Han F B, He C H, Zhou H 2002 Acta Phys. Sin. 51 2315(in Chinese)[郭红霞、陈雨生、张义门、韩福斌、贺朝会、周 辉 2002 物理学报 51 2315]

    [9]

    He B P, Guo H X, Gong J C, Wang G Z, Luo Y H, Li Y H 2004 Acta Phys. Sin. 53 3125 (in Chinese)[何宝平、郭红霞、龚建成、王桂珍、罗尹虹、李永宏 2004 物理学报 53 3125]

    [10]

    Li L L, Liu H X, Yu Z G, Hao Y 2006 Acta Phys. Sin. 55 2459 (in Chinese)[李蕾蕾、刘红侠、于宗光、郝 跃 2006 物理学报 55 2459]

    [11]

    Yu Z G, Lu F, Xu Z, Ye S Y, Huang W, Wang W Y, Xu J Y, 2000 Acta Electr. Sin. 28 90 (in Chinese) [于宗光、陆 锋、徐 征、叶守银、黄 卫、王万业、许居衍 2000 电子学报 28 90]

    [12]

    He C H, Geng B, Yang H L, Chen X H, Wang Y P, Li G Z 2003 Acta Phys. Sin. 52 180 (in Chinese)[贺朝会、耿 斌、杨海亮、陈晓华、王燕萍、李国政 2003 物理学报 52 180]

    [13]

    He C H, Geng B, Yang H L, Chen X H, Li G Z, Wang Y P 2003 Acta Phys. Sin. 52 2235 (in Chinese)[贺朝会、耿 斌、杨海亮、陈晓华、李国政、王燕萍 2003 物理学报 52 2235]

    [14]

    Du P Y, Lue H T, Wang S Y, Huang T Y, Hsieh K Y, Liu R, Lu C Y 2008 IEEE Tran.Elect. Dev. 55 2230

    [15]

    Wu A M, Chen J, Zhang E X, Yang H, Zhang Z X, Wang X 2007 Functional Materials Information 38 866 (in Chinese) [武爱民、陈 静、 张恩霞、 杨 慧、 张正选、 王 曦 2007 功能材料信息38 866]

    [16]

    Cai J R 2004 Electronisc and Packing 4 20 (in Chinese)[蔡菊容 2004 电子与封装 4 20]

    [17]

    White M H, Adams D A, Murray J R, Wrazien S, Zhao E, Wang Y, Khan B, Miller W, Mehrotra R 2004 Non-Volatile Memory Technology Symposium Orlando, USA, November 15—17 , 2004 p51

    [18]

    Wallinger T 2007 Semiconductor International 30 49

  • [1]

    Kuesters K H, Ludwig C, Mikolajick T, Nagel N, Specht M, Pissors V, Schulze N, Stein N, Willer J 2006 ICSICT'06. 8th International Conference on Solid-State and Integrated Circuit Technology Shanghai, Oct. 23—26 p740

    [2]

    Fang S H, Cheng X L, 2007 Chinese Journal of Electron Devices 30 1211 (in Chinese)[房少华、程秀兰 2007 电子器件 30 1211]

    [3]

    White M H, Adams D A, Bu J 2000 IEEE Circuit. Devic. 16 22

    [4]

    Takeuchi H, King T J 2003 IEEE Electr. Device Lett. 24 309

    [5]

    Wellekens D, Groeseneken G, Houdt J V, Maes H E 1993 IEEE Trans. Nuc. Sci. 40 1619

    [6]

    Cellere G, Pellati P, Chimerton A, Modelli A, Larcher L, PACSagrella A 2001 IEEE Trans. Nuc. Sci. 48 2222

    [7]

    Fang S H, Cheng X L, Huang Y, Gu H H 2007 Acta Phys. Sin. 56 6634(in Chinese)[房少华、程秀兰、黄 晔、顾怀怀 2007 物理学报 56 6634]

    [8]

    Guo H X, Chen Y S, Zhang Y M, Han F B, He C H, Zhou H 2002 Acta Phys. Sin. 51 2315(in Chinese)[郭红霞、陈雨生、张义门、韩福斌、贺朝会、周 辉 2002 物理学报 51 2315]

    [9]

    He B P, Guo H X, Gong J C, Wang G Z, Luo Y H, Li Y H 2004 Acta Phys. Sin. 53 3125 (in Chinese)[何宝平、郭红霞、龚建成、王桂珍、罗尹虹、李永宏 2004 物理学报 53 3125]

    [10]

    Li L L, Liu H X, Yu Z G, Hao Y 2006 Acta Phys. Sin. 55 2459 (in Chinese)[李蕾蕾、刘红侠、于宗光、郝 跃 2006 物理学报 55 2459]

    [11]

    Yu Z G, Lu F, Xu Z, Ye S Y, Huang W, Wang W Y, Xu J Y, 2000 Acta Electr. Sin. 28 90 (in Chinese) [于宗光、陆 锋、徐 征、叶守银、黄 卫、王万业、许居衍 2000 电子学报 28 90]

    [12]

    He C H, Geng B, Yang H L, Chen X H, Wang Y P, Li G Z 2003 Acta Phys. Sin. 52 180 (in Chinese)[贺朝会、耿 斌、杨海亮、陈晓华、王燕萍、李国政 2003 物理学报 52 180]

    [13]

    He C H, Geng B, Yang H L, Chen X H, Li G Z, Wang Y P 2003 Acta Phys. Sin. 52 2235 (in Chinese)[贺朝会、耿 斌、杨海亮、陈晓华、李国政、王燕萍 2003 物理学报 52 2235]

    [14]

    Du P Y, Lue H T, Wang S Y, Huang T Y, Hsieh K Y, Liu R, Lu C Y 2008 IEEE Tran.Elect. Dev. 55 2230

    [15]

    Wu A M, Chen J, Zhang E X, Yang H, Zhang Z X, Wang X 2007 Functional Materials Information 38 866 (in Chinese) [武爱民、陈 静、 张恩霞、 杨 慧、 张正选、 王 曦 2007 功能材料信息38 866]

    [16]

    Cai J R 2004 Electronisc and Packing 4 20 (in Chinese)[蔡菊容 2004 电子与封装 4 20]

    [17]

    White M H, Adams D A, Murray J R, Wrazien S, Zhao E, Wang Y, Khan B, Miller W, Mehrotra R 2004 Non-Volatile Memory Technology Symposium Orlando, USA, November 15—17 , 2004 p51

    [18]

    Wallinger T 2007 Semiconductor International 30 49

  • [1] Zhang Lin, Ma Lin-Dong, Du Lin, Li Yan-Bo, Xu Xian-Feng, Huang Xin-Rong. Transient characteristics simulation of total ionizing dose effect on Si n-metal-oxide-semiconductor field effect transistor under different gate voltage. Acta Physica Sinica, 2023, 72(13): 138501. doi: 10.7498/aps.72.20230207
    [2] Li Fen-Fei, Zhou Xiao-Yan, Zhang Kui-Bao, Shi Zhao-Hua, Chen Jin-Zhan, Ye Xin, Wu Wei-Dong, Li Bo. Effects of neutron irradiation on optical characteristics of Yb-doped fiber materials. Acta Physica Sinica, 2021, 70(19): 190201. doi: 10.7498/aps.70.20210083
    [3] Wang Cheng-Long, Wang Qing-Yu, Zhang Yue, Li Zhong-Yu, Hong Bing, Su Zhe, Dong Liang. Molecular dynamics study of cascade damage at SiC/C interface. Acta Physica Sinica, 2014, 63(15): 153402. doi: 10.7498/aps.63.153402
    [4] Ning Bing-Xu, Hu Zhi-Yuan, Zhang Zheng-Xuan, Bi Da-Wei, Huang Hui-Xiang, Dai Ruo-Fan, Zhang Yan-Wei, Zou Shi-Chang. Effects of total ionizing dose on narrow-channel SOI NMOSFETs. Acta Physica Sinica, 2013, 62(7): 076104. doi: 10.7498/aps.62.076104
    [5] Zhang Ming-Lan, Yang Rui-Xia, Li Zhuo-Xin, Cao Xing-Zhong, Wang Bao-Yi, Wang Xiao-Hui. Study on proton irradiation induced defects in GaN thick film. Acta Physica Sinica, 2013, 62(11): 117103. doi: 10.7498/aps.62.117103
    [6] Shang Huai-Chao, Liu Hong-Xia, Zhuo Qing-Qing. Degradation mechanism of SOI NMOS devices exposed to 60Co γ-ray at low dose rate. Acta Physica Sinica, 2012, 61(24): 246101. doi: 10.7498/aps.61.246101
    [7] Zhuo Qing-Qing, Liu Hong-Xia, Yang Zhao-Nian, Cai Hui-Min, Hao Yue. The total dose irradiation effects of SOI NMOS devices under different bias conditions. Acta Physica Sinica, 2012, 61(22): 220702. doi: 10.7498/aps.61.220702
    [8] Peng Li, Zhuo Qing-Qing, Liu Hong-Xia, Cai Hui-Min. Gate length dependence of SOI NMOS device response to total dose irradiation. Acta Physica Sinica, 2012, 61(24): 240703. doi: 10.7498/aps.61.240703
    [9] Li Xi-Bin, Yuan Xiao-Dong, He Shao-Bo, Lü Hai-Bing, Wang Hai-Jun, Xiang Xia, Zheng Wan-Guo. Influence of laser passivation on fused silica damage after CO2 laser mitigation. Acta Physica Sinica, 2012, 61(6): 064401. doi: 10.7498/aps.61.064401
    [10] Sheng Yu-Bang, Yang Lü-Yun, Luan Huai-Xun, Liu Zi-Jun, Li Jin-Yan, Dai Neng-Li. Gamma radiation effects on absorption and emission properties of erbium-doped silicate glasses. Acta Physica Sinica, 2012, 61(11): 116301. doi: 10.7498/aps.61.116301
    [11] Zhang Lin, Xiao Jian, Qiu Yang-Zhang, Cheng Hong-Liang. Radition effect on Ti/4H-SiC SBD of gamma-ray,electrons and neutrons. Acta Physica Sinica, 2011, 60(5): 056106. doi: 10.7498/aps.60.056106
    [12] Zhang Dong, Lu Xi-Rui, Yang Yan-Kai, Cui Chun-Long, Chen Meng-Jun. Capability of resisting γ-ray irradiation and Rietveld structurerefinement of zircon. Acta Physica Sinica, 2011, 60(7): 078901. doi: 10.7498/aps.60.078901
    [13] Yu Zong-Guang, Xiao Zhi-Qiang, Zhou Xin-Jie, Li Lei-Lei. Threshold voltage degradation mechanism of SOI SONOS EEPROM under total-dose irradiation. Acta Physica Sinica, 2011, 60(9): 098502. doi: 10.7498/aps.60.098502
    [14] Yu Jun, Zhou Peng, Zhao Heng-Yu, Wu Feng, Xia Hai-Ping, Su Liang-Bi, Xu Jun. Study on near-infrared broadband emission spectroscopic properties of Bi-doped α-BaB2O4 single crystal induced by γ-irradiation. Acta Physica Sinica, 2010, 59(5): 3538-3541. doi: 10.7498/aps.59.3538
    [15] Shen Zi-Cai, Kong Wei-Jin, Feng Wei-Quan, Ding Yi-Gang, Liu Yu-Ming, Zheng Hui-Qi, Zhao Xue, Zhao Chun-Qing. Degradation model of the optical properties of the thermal control coatings. Acta Physica Sinica, 2009, 58(2): 860-864. doi: 10.7498/aps.58.860
    [16] Peng Shao-Quan, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, He Liang, Chen Wei-Hua. Radiation degradation model of metal-oxide-semiconductor field effect transistor based on pre-irradiation 1/f noise. Acta Physica Sinica, 2008, 57(8): 5205-5211. doi: 10.7498/aps.57.5205
    [17] Zhang Ke-Yan. Phase transition speed research of metal material at laser irradiation medium strength. Acta Physica Sinica, 2004, 53(6): 1815-1819. doi: 10.7498/aps.53.1815
    [18] He Chao-Hui, Geng Bin, Yang Hai-Liang, Chen Xiao-Hua, Li Guo-Zheng, Wang Yan-Ping. Mechanism of radiation effects in floating gate ROMs. Acta Physica Sinica, 2003, 52(9): 2235-2238. doi: 10.7498/aps.52.2235
    [19] He Chao-Hui, Geng Bin, Yang Hai-Liang, Chen Xiao-Hua, Wang Yan-Ping, Li Guo-Zheng. Experimental study on irradiation effects in floating gate ROMs. Acta Physica Sinica, 2003, 52(1): 180-187. doi: 10.7498/aps.52.180
    [20] Guo Hong-Xia, Chen Yu-Sheng, Zhang Yi-Men, Han Fu-Bin, He Chao-Hui, Zhou Hui. . Acta Physica Sinica, 2002, 51(10): 2315-2319. doi: 10.7498/aps.51.2315
Metrics
  • Abstract views:  8447
  • PDF Downloads:  882
  • Cited By: 0
Publishing process
  • Received Date:  06 April 2010
  • Accepted Date:  24 May 2010
  • Published Online:  05 January 2011

/

返回文章
返回