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NiO films are prepared with radio frequency magnetron sputtering. Ellipsometric experiment results show that NiO film is transparent for visible light,and its refractive index can be modified by changing Tsub and annealing temperature. Scanning electron microscopy and X-ray diffraction experiment results show that Tsub and annealing temperature can modify the morphology and crystal structure of NiO film which can further modify the conductivity of NiO. The optimized NiO film is used in polymer solar cell (PSC) as an anode blocking layer. The experimental results show that NiO is a better candidate than the PEDOT:PSS often used as an anode blocking layer for PSC. The power conversion efficiency of PSC with NiO reaches 2.26% which is three times as high as that with PEDOT:PSS.
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Keywords:
- NiO film /
- anode blocking layer /
- polymer solar cells
[1] Scharber M C , Mühlbacher D, Koppe M, Denk P, Waldauf C, Heeger A J , Brabec C J 2006 Adv. Mater. 18 789
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[3] Yu H Z, Wen Y X 2011 Acta Phys. Sin. 60 038401 (in Chinese) [於黄忠, 温源鑫 2011 物理学报 60 038401]
[4] Hau S K, Yip H, Ma H, Jen A K Y 2008 Appl. Phys. Letts. 93 233304
[5] Chen L M, Xu Z, Hong Z, Yang Y 2010 J. Mat. Chem. 20 2575
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[7] Feng Z H, Hou Y B, Shi Q M, Qin L F, Li Y, Zhang L, Liu X J, Teng F, Wang Y S, Xia R D 2010 Chin. Phys. B 19 038601
[8] Liu X D, Xu Z, Zhang F J, Zhao S L, Zhang T H, Gong W, Song J L, Kong C, Yan G, Xu X R 2010 Chin. Phys. B 19 118601
[9] Jorgensen M, Norrman K, Krebs F C 2008 Sol. Energ. Mat. Sol. C 92 686
[10] Horng R H,Wuu D S, Lien Y C, LanWH 2001 Appl. Phys. Letts. 79 2925
[11] Chen H L, Yang Y S 2008 Thin Solid Films 516 5590
[12] Jang W L, Lu Y M 2008 Surface & Coatings Technology 202 5444
[13] He J, Lindstrom H, Hagfeldt A, Lindquist S E 1999 J. Phys. Chem. B 103 8940
[14] Bandara J, Weerasinghe H 2005 Sol. Energ. Mat. Sol. C 85 385
[15] Servaites J D, Yeganeh S, Marks T J, RatnerMA 2010 Adv. Funct. Mater. 20 97
[16] Kim J Y, Lee K, Coates N E, Moses D, Nguyen T Q, Dante M, Heeger A J 2007 Science 317 222
[17] Ryu H W, Choi G P 2004 Journal of Materials Science 39 4375
[18] Chena H L, Lu Y M 2005 Surface & Coatings Technology 198 138
[19] Sato H, Minami T, Takata S, Yamada T 1993 Thin Solid Films 236 27
[20] Biju V, Abdul Khadar M 2001 Materials Research Bulletin 36 21
[21] Liu J, Hains A W, Servaites J D, Ratner M A, Marks T J 2009 Chem. Mater. 21 5258
[22] Mori S, Fukuda S, Sumikura S, Takeda Y, Tamaki Y, Suzuki E, Abe T 2008 J. Phys. Chem. C 112 16134
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[1] Scharber M C , Mühlbacher D, Koppe M, Denk P, Waldauf C, Heeger A J , Brabec C J 2006 Adv. Mater. 18 789
[2] Brabec C J, Shaheen S E, Winder C, Sariciftci N S, Rispens M T, Denk P 2002 Appl. Phys. Letts. 80 1288
[3] Yu H Z, Wen Y X 2011 Acta Phys. Sin. 60 038401 (in Chinese) [於黄忠, 温源鑫 2011 物理学报 60 038401]
[4] Hau S K, Yip H, Ma H, Jen A K Y 2008 Appl. Phys. Letts. 93 233304
[5] Chen L M, Xu Z, Hong Z, Yang Y 2010 J. Mat. Chem. 20 2575
[6] Steim R, Kogler F R, Brabec C J 2010 J. Mat. Chem. 20 2499
[7] Feng Z H, Hou Y B, Shi Q M, Qin L F, Li Y, Zhang L, Liu X J, Teng F, Wang Y S, Xia R D 2010 Chin. Phys. B 19 038601
[8] Liu X D, Xu Z, Zhang F J, Zhao S L, Zhang T H, Gong W, Song J L, Kong C, Yan G, Xu X R 2010 Chin. Phys. B 19 118601
[9] Jorgensen M, Norrman K, Krebs F C 2008 Sol. Energ. Mat. Sol. C 92 686
[10] Horng R H,Wuu D S, Lien Y C, LanWH 2001 Appl. Phys. Letts. 79 2925
[11] Chen H L, Yang Y S 2008 Thin Solid Films 516 5590
[12] Jang W L, Lu Y M 2008 Surface & Coatings Technology 202 5444
[13] He J, Lindstrom H, Hagfeldt A, Lindquist S E 1999 J. Phys. Chem. B 103 8940
[14] Bandara J, Weerasinghe H 2005 Sol. Energ. Mat. Sol. C 85 385
[15] Servaites J D, Yeganeh S, Marks T J, RatnerMA 2010 Adv. Funct. Mater. 20 97
[16] Kim J Y, Lee K, Coates N E, Moses D, Nguyen T Q, Dante M, Heeger A J 2007 Science 317 222
[17] Ryu H W, Choi G P 2004 Journal of Materials Science 39 4375
[18] Chena H L, Lu Y M 2005 Surface & Coatings Technology 198 138
[19] Sato H, Minami T, Takata S, Yamada T 1993 Thin Solid Films 236 27
[20] Biju V, Abdul Khadar M 2001 Materials Research Bulletin 36 21
[21] Liu J, Hains A W, Servaites J D, Ratner M A, Marks T J 2009 Chem. Mater. 21 5258
[22] Mori S, Fukuda S, Sumikura S, Takeda Y, Tamaki Y, Suzuki E, Abe T 2008 J. Phys. Chem. C 112 16134
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