Search

Article

x

留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

Degradation mechanism of SOI NMOS devices exposed to 60Co γ-ray at low dose rate

Shang Huai-Chao Liu Hong-Xia Zhuo Qing-Qing

Citation:

Degradation mechanism of SOI NMOS devices exposed to 60Co γ-ray at low dose rate

Shang Huai-Chao, Liu Hong-Xia, Zhuo Qing-Qing
PDF
Get Citation

(PLEASE TRANSLATE TO ENGLISH

BY GOOGLE TRANSLATE IF NEEDED.)

Metrics
  • Abstract views:  7258
  • PDF Downloads:  636
  • Cited By: 0
Publishing process
  • Received Date:  11 June 2012
  • Accepted Date:  12 July 2012
  • Published Online:  05 December 2012

/

返回文章
返回