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Frequency of an internal-mirror He-Ne laser is stabilized by using a micro cooling fan, instead of traditional heating method. Both the relationship between driving voltage and rotating speed and the thermal expansion of the intermal-mirror laser are discussed. The cavity length of the laser is controlled and adjusted by air cooling. The frequency stabilization is based on a theory of power balance between two longitudinal modes. The average temperature of the laser tube is less than 50 ℃ when the frequency is stabilized. A frequency fluctuation of less than 1.4 MHz in 20 h and a frequency relative standard uncertainty of U=4.710-9 in 4 months are evaluated by measuring the beat signal with a high-precision laser stabilized by iodine.
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Keywords:
- internal-mirror He-Ne laser /
- air cooling /
- power balance of two longitudinal modes /
- temperature of laser tube
[1] Bobroff N 1993 Meas. Sci. Technol. 4 907
[2] Lawall J 2004 Opt. Photon. News 15 40
[3] Parks H V, Faller J E, Robertson D S 2001 IEEE Trans. Instrum. Meas. 50 598
[4] Lawall J 2005 J. Opt. Soc. Am. A 222786
[5] Balhorn R, Kunzmann H, Lebowsky F 1972 Appl. Opt. 11 742
[6] Niebauer T M, Faller J E, Godwin H M, Hall J L, Barger R L 1988 Appl. Opt. 27 1285
[7] Umeda N, Tsukiji M, Takasaki H 1980 Appl. Opt. 19 442
[8] Sasaki A, Hayashi T 1982 Jpn. J. Appl. Phys. 21 1455
[9] Pan C L, Jean P Y 1986 Appl. Opt. 25 2126
[10] Fellman T, Jungner P, Stahlberg B 1987 Appl. Opt. 26 2705
[11] Eom T, Choi H, Lee S 2002 Rev. Sci. Instrum. 73 221
[12] Qian J, Liu X Y, Shi C Y, Liu Z Y, Tan H P, Cai S, Chan T K, Lan Y-P, Ishikawa J, Dahlan A M, Howick E, Louise M , Tonmueanwai A 2007 Metrologia 44 04005
[13] Ciddor P E, Duffy R M 1983 J. Phys. E: Sci. Instrum. 16 1223
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[1] Bobroff N 1993 Meas. Sci. Technol. 4 907
[2] Lawall J 2004 Opt. Photon. News 15 40
[3] Parks H V, Faller J E, Robertson D S 2001 IEEE Trans. Instrum. Meas. 50 598
[4] Lawall J 2005 J. Opt. Soc. Am. A 222786
[5] Balhorn R, Kunzmann H, Lebowsky F 1972 Appl. Opt. 11 742
[6] Niebauer T M, Faller J E, Godwin H M, Hall J L, Barger R L 1988 Appl. Opt. 27 1285
[7] Umeda N, Tsukiji M, Takasaki H 1980 Appl. Opt. 19 442
[8] Sasaki A, Hayashi T 1982 Jpn. J. Appl. Phys. 21 1455
[9] Pan C L, Jean P Y 1986 Appl. Opt. 25 2126
[10] Fellman T, Jungner P, Stahlberg B 1987 Appl. Opt. 26 2705
[11] Eom T, Choi H, Lee S 2002 Rev. Sci. Instrum. 73 221
[12] Qian J, Liu X Y, Shi C Y, Liu Z Y, Tan H P, Cai S, Chan T K, Lan Y-P, Ishikawa J, Dahlan A M, Howick E, Louise M , Tonmueanwai A 2007 Metrologia 44 04005
[13] Ciddor P E, Duffy R M 1983 J. Phys. E: Sci. Instrum. 16 1223
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