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Recently, magnetic force microscope (MFM) for dynamic imaging of AC magnetic field has attracted considerable attention due to its potential applications and special requirements in industry. In this paper, we develop an alternating force MFM technique based on the frequency modulation of MFM tip oscillation, which provides a powerful tool for the development of key technologies in magnetic information storage industry. Different from conventional MFM, the main points of the present work are: 1) the investigation of the frequency-modulation phenomenon; 2) optimization of the MFM tip parameter, and introduction of the MFM signal processing apparatus; 3) observation of the AC magnetic field. For dynamic evaluation of AC magnetic field, we need to theoretically analyze the mechanical and magnetic properties of MFM tips, to technically develop the MFM signal processing apparatus, and to experimentally image the dynamic magnetic signals. Finally, we demonstrate the alternating force MFM technique, which can measure and analyze the nano-scale magnetic domain structures in advanced magnetic materials.
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Keywords:
- magnetic force microscopy /
- nanomagnetism /
- dynamic magnetism /
- frequency modulation
[1] Xue H, Ma Z M, Shi Y B, Tang J, Xue C Y, Liu Jun, Li Y J 2013 Acta Phys. Sin. 62 180704 (in Chinese)[薛慧, 马宗敏, 石云波, 唐军, 薛晨阳, 刘俊, 李艳君 2013 物理学报 62 180704]
[2] [3] Fang Y K, Zhu M G, Guo Y Q, Li W, Han B S 2004 Chin. Phys. Lett. 21 1655
[4] [5] Li X M, Fang Y K, Guo Z H, Liu T, Guo Y Q, Li W, Han B S 2008 Chin. Phys. B 17 2281
[6] [7] Liu L W, Dang H G, Sheng W, Wang Y, Cao J W, Bai J M, Wei F L 2013 Chin. Phys. B 22 047503
[8] [9] Li H, Qi X Y, Wu J, Zeng Z Y, Wei J, Zhang H 2013 ACS Nano 7 2842
[10] Schwenk J, Marioni M, Romer S, Joshi N R, Hug H J 2014 Appl. Phys. Lett. 104 112412
[11] [12] Tabasum M R, Zighem F, Medina J D L T, Encinas A, Piraux L, Nysten B 2013 J. Appl. Phys. 113 183908
[13] [14] [15] Freire I, Bates J R, Miyahara Y, Asenjo A, Grtter P H 2013 Appl. Phys. Lett. 102 022417
[16] [17] Candocia F M, Svedberg E B, Litvinov D, Khizroev S 2004 Nanotechnol 15 575
[18] Li Z H, Hatakeyama K, Egawa G, Yoshimura S, Saito H 2012 Appl. Phys. Lett. 100 222405
[19] [20] Saito H, Ikeya H, Egawa G, Ishio S, Yoshimura S 2009 J. Appl. Phys. 105 07D524
[21] [22] [23] Abe M, TanaKa Y 2002 IEEE Trans. Magn. 38 45
[24] Li S P, Stokes S, Liu Y, Schroder S F, Zhu W, Palmer D 2002 J. Appl. Phys. 91 7346
[25] [26] [27] Koblischka M R, Wei J D, Kirsch M, Hartmann U 2006 Jpn. J. Appl. Phys. 45 2238
[28] [29] Proksch R, Neilson P, Austvold S, Schmidt J J 1999 Appl. Phys. Lett. 74 1308
[30] Lu W, Li Z H, Hatakeyama K, Egawa G, Yoshimura S, Saito H 2010 Appl. Phys. Lett. 96 143104
[31] [32] [33] Albrecht T R, Grutter P, Horne D, Rugar D 1991 J. Appl. Phys. 69 668
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[1] Xue H, Ma Z M, Shi Y B, Tang J, Xue C Y, Liu Jun, Li Y J 2013 Acta Phys. Sin. 62 180704 (in Chinese)[薛慧, 马宗敏, 石云波, 唐军, 薛晨阳, 刘俊, 李艳君 2013 物理学报 62 180704]
[2] [3] Fang Y K, Zhu M G, Guo Y Q, Li W, Han B S 2004 Chin. Phys. Lett. 21 1655
[4] [5] Li X M, Fang Y K, Guo Z H, Liu T, Guo Y Q, Li W, Han B S 2008 Chin. Phys. B 17 2281
[6] [7] Liu L W, Dang H G, Sheng W, Wang Y, Cao J W, Bai J M, Wei F L 2013 Chin. Phys. B 22 047503
[8] [9] Li H, Qi X Y, Wu J, Zeng Z Y, Wei J, Zhang H 2013 ACS Nano 7 2842
[10] Schwenk J, Marioni M, Romer S, Joshi N R, Hug H J 2014 Appl. Phys. Lett. 104 112412
[11] [12] Tabasum M R, Zighem F, Medina J D L T, Encinas A, Piraux L, Nysten B 2013 J. Appl. Phys. 113 183908
[13] [14] [15] Freire I, Bates J R, Miyahara Y, Asenjo A, Grtter P H 2013 Appl. Phys. Lett. 102 022417
[16] [17] Candocia F M, Svedberg E B, Litvinov D, Khizroev S 2004 Nanotechnol 15 575
[18] Li Z H, Hatakeyama K, Egawa G, Yoshimura S, Saito H 2012 Appl. Phys. Lett. 100 222405
[19] [20] Saito H, Ikeya H, Egawa G, Ishio S, Yoshimura S 2009 J. Appl. Phys. 105 07D524
[21] [22] [23] Abe M, TanaKa Y 2002 IEEE Trans. Magn. 38 45
[24] Li S P, Stokes S, Liu Y, Schroder S F, Zhu W, Palmer D 2002 J. Appl. Phys. 91 7346
[25] [26] [27] Koblischka M R, Wei J D, Kirsch M, Hartmann U 2006 Jpn. J. Appl. Phys. 45 2238
[28] [29] Proksch R, Neilson P, Austvold S, Schmidt J J 1999 Appl. Phys. Lett. 74 1308
[30] Lu W, Li Z H, Hatakeyama K, Egawa G, Yoshimura S, Saito H 2010 Appl. Phys. Lett. 96 143104
[31] [32] [33] Albrecht T R, Grutter P, Horne D, Rugar D 1991 J. Appl. Phys. 69 668
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