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Effects of Nb doping concentration on TiO2 electricel conductivity and optical performance

Hou Qing-Yu Lv Zhi-Yuan Zhao Chun-Wang

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Effects of Nb doping concentration on TiO2 electricel conductivity and optical performance

Hou Qing-Yu, Lv Zhi-Yuan, Zhao Chun-Wang
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  • Nowadays, in the reports of Nb heavy-doped TiO2, when the doping mole of Nb is in the range of 0.050 to 0.0625, there is a current controversy between the two experimental results about the minimum resistance of the doped systems. To solve this contradiction, the models of un-doped and the three different concentrations of Nb doped Ti1-xNbxO2 (x=0.03125, 0.050, 0.0625) have been set up based on the first-principles plane wave ultra-soft pseudo potential method of density functional theory; then the geometry optimization of all models is carried out; and the band structures, the density of states, and optical properties are calculated. Results reveal that under the condition of limited doping amount as in this paper, when the doping moles of Nb is increased, the volume, the total energy, and the formation energy of the doped system are increased; the doped system has a lower stability and is hard to be redoped; the relative electronic concentration, and the electron effective mass are increased; the migration rate is reduced, and the conductivity is thus reduced. The wider the optical band-gap, the more obvious the shift of absorption edge to the short wavelength side, the lower the absorptivity and reflectivity; and the transmittance is increased. these are in agreement with the experimental results.
    • Funds: Project was supported by the National Natural Science Foundation of China (Grant Nos. 61366008 51261017) and the “Spring Sunshine” Project of Ministry of Education of Chinaand the College Science Research Project of Inner Mongolia Autonomous Region (Grant No. NJZZ13099). All the calculations were carried out at the Network Information and Computing Center of Beijing University of Aeronautics and Astronautics University.
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    Zhao L, Han J H, Li R P, Wang L G, Huang M J 2013 Chin. Phys. B 22 124207

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    Sato Y, Akizuki H, Kamiyama T, Shigesato Y 2008 Thin. Solid. Films 516 5758

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    Lee H Y, Robertson J 2013 J. Appl. Phys. 113 213706

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    Hitosugi T, Yamada N, Nakao S, Hirose Y, Hasegawa T 2010 Phys. Status. Solidi. A 207 1529

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    L X J, Mou X L, Wu J J, Zhang D W, Zhang L L, Huang F Q, Xu F F, Huang S M 2010 Adv. Funct. Mater. 20 509

    [13]

    Kaleji B K, Mamoory R S, Fujishima A 2012 Mater. Chem. Phys. 132 210

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    Burdett J K, Hughbanks T 1987 J. Am. Chem. Soc. 109 3639

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    Archana P S, Jose R, Jin T M, Vijila C, Yusoff M M, Ramakrishna S 2010 J. Am. Ceram. Soc. 93 4096

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    Furubayashi Y, Yamada N, Hirose Y, Yamamoto Y, Otani M 2007 J. Appl. Phys. t 101 093705

    [17]

    Kaleji B K, Mamoory R S, Fujishima A 2012 Mater. Chem. Phys. 132 210

    [18]

    Li M, Zhang J Y, Zhang Y 2012 Chem. Phys. Lett. 527 63

    [19]

    Na P S, Smith M F, Kim K, Du M H, Wei S H, Zhang S B, Limpijumn ong S 2006 Phys. Rev. B 73 125205

    [20]

    Tang H, Prasad K, Sanjinès R, Schmid P E, Lévy F 1994 J. Appl. Phys. 75 2042

    [21]

    Yang K S, Da Y, Huang B B 2008 Chem. Phys. Lett. 456 71

    [22]

    Lu J G, Fujita S, Kawaharamura T T, Nishinaka H, Kamada Y, Ohshima T 2006 Appl. Phys. Lett. 89 262107

    [23]

    Hirose Y, Yamada N, Nakao S, Hitosugi T, Shimada T, Hasegawa T 2009 Phys. Rev. B 79 16518

    [24]

    Huy H A, Aradi B, Frauenheim T, Deák P 2012 J. Appl. Phys. 112 016103

    [25]

    Furubayashi Y, Yamada N, Hirose Y, Yamamoto Y, Otani M, Hitosugi T, Shimada T, Hasegawa T 2007 J. Appl. Phys. 101 093705

    [26]

    Liu J M, Zhao X R, Duan L B, Cao M M, Sun H N, Shao J F, Chen S A, Xie H Y, Chang X, Chen C L 2011 Appl. Surf. Sci. 257 10156

    [27]

    Lu E K, Zhu B S, Luo J S 1998 Semiconductor Physics (Xi' an: Xi' an Jiaotong University Press) p103 (in Chinese) [刘恩科, 朱秉升, 罗晋生1998半导体物理(西安: 西安交通大学出版社)第103页]

    [28]

    Li P, Deng S H, Zhang L, Yu J Y, Liu G H 2010 Chin Phys. B 19 117102

    [29]

    Eucken A, Biichner U A 1934 Z. Phys. Chem. B 27 321

    [30]

    Roberts S 1949 Phys. Rev. 76 1215

    [31]

    Lu J G, Fujita S, Kawaharamura T T, Nishinaka H, Kamada Y, Ohshima T 2006 Appl. Phys. Lett. 89 262107

    [32]

    Shen X C 2002 Semiconductor Spectroscopy and Optical Properties (Beijing: Science press) p140-141 (in Chinese) [沈学础2002半导体光谱和光学性质(第二版) (北京: 科学出版社)第140–141页]

  • [1]

    Fujishima A, Honda K 1972 Nature 238 37

    [2]

    Gelover S, Mondragón P, Jiménez A 2004 J. Photoch. Photobio. A 165 241

    [3]

    Herrmann J M, Guillard C, Disdier J, Lehaut C, Malato S, Blanco 2002 J, App. Catal. B: Environ. 35 281

    [4]

    Li J J, Li B, Peng Q M, Zhou J, Li L T 2014 Chin. Phys. B 23 098104

    [5]

    Zhao L, Han J H, Li R P, Wang L G, Huang M J 2013 Chin. Phys. B 22 124207

    [6]

    Zhang S X, Kundaliya D C, Yu W, Dhar S, Young S Y, Salamanca R L G, Ogale S B, Vispute R D, Venkatesan T 2007 J. Appl. Phys. 102 013701

    [7]

    Sato Y, Akizuki H, Kamiyama T, Shigesato Y 2008 Thin. Solid. Films 516 5758

    [8]

    Furubayashi Y, Yamada N, Hirose Y, Yamamoto Y, Otani M 2007 J. Appl. Phys. 101 093705

    [9]

    Zhang R S, Liu Y, Gao Q, Teng F, Songa C L, Wang W, Han G R 2011 J. Alloy. Compd. 509 9178

    [10]

    Lee H Y, Robertson J 2013 J. Appl. Phys. 113 213706

    [11]

    Hitosugi T, Yamada N, Nakao S, Hirose Y, Hasegawa T 2010 Phys. Status. Solidi. A 207 1529

    [12]

    L X J, Mou X L, Wu J J, Zhang D W, Zhang L L, Huang F Q, Xu F F, Huang S M 2010 Adv. Funct. Mater. 20 509

    [13]

    Kaleji B K, Mamoory R S, Fujishima A 2012 Mater. Chem. Phys. 132 210

    [14]

    Burdett J K, Hughbanks T 1987 J. Am. Chem. Soc. 109 3639

    [15]

    Archana P S, Jose R, Jin T M, Vijila C, Yusoff M M, Ramakrishna S 2010 J. Am. Ceram. Soc. 93 4096

    [16]

    Furubayashi Y, Yamada N, Hirose Y, Yamamoto Y, Otani M 2007 J. Appl. Phys. t 101 093705

    [17]

    Kaleji B K, Mamoory R S, Fujishima A 2012 Mater. Chem. Phys. 132 210

    [18]

    Li M, Zhang J Y, Zhang Y 2012 Chem. Phys. Lett. 527 63

    [19]

    Na P S, Smith M F, Kim K, Du M H, Wei S H, Zhang S B, Limpijumn ong S 2006 Phys. Rev. B 73 125205

    [20]

    Tang H, Prasad K, Sanjinès R, Schmid P E, Lévy F 1994 J. Appl. Phys. 75 2042

    [21]

    Yang K S, Da Y, Huang B B 2008 Chem. Phys. Lett. 456 71

    [22]

    Lu J G, Fujita S, Kawaharamura T T, Nishinaka H, Kamada Y, Ohshima T 2006 Appl. Phys. Lett. 89 262107

    [23]

    Hirose Y, Yamada N, Nakao S, Hitosugi T, Shimada T, Hasegawa T 2009 Phys. Rev. B 79 16518

    [24]

    Huy H A, Aradi B, Frauenheim T, Deák P 2012 J. Appl. Phys. 112 016103

    [25]

    Furubayashi Y, Yamada N, Hirose Y, Yamamoto Y, Otani M, Hitosugi T, Shimada T, Hasegawa T 2007 J. Appl. Phys. 101 093705

    [26]

    Liu J M, Zhao X R, Duan L B, Cao M M, Sun H N, Shao J F, Chen S A, Xie H Y, Chang X, Chen C L 2011 Appl. Surf. Sci. 257 10156

    [27]

    Lu E K, Zhu B S, Luo J S 1998 Semiconductor Physics (Xi' an: Xi' an Jiaotong University Press) p103 (in Chinese) [刘恩科, 朱秉升, 罗晋生1998半导体物理(西安: 西安交通大学出版社)第103页]

    [28]

    Li P, Deng S H, Zhang L, Yu J Y, Liu G H 2010 Chin Phys. B 19 117102

    [29]

    Eucken A, Biichner U A 1934 Z. Phys. Chem. B 27 321

    [30]

    Roberts S 1949 Phys. Rev. 76 1215

    [31]

    Lu J G, Fujita S, Kawaharamura T T, Nishinaka H, Kamada Y, Ohshima T 2006 Appl. Phys. Lett. 89 262107

    [32]

    Shen X C 2002 Semiconductor Spectroscopy and Optical Properties (Beijing: Science press) p140-141 (in Chinese) [沈学础2002半导体光谱和光学性质(第二版) (北京: 科学出版社)第140–141页]

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Publishing process
  • Received Date:  09 June 2014
  • Accepted Date:  05 September 2014
  • Published Online:  05 January 2015

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