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Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry

Li Jiang Tang Jing-You Pei Wang Wei Xian-Hua Huang Feng

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Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry

Li Jiang, Tang Jing-You, Pei Wang, Wei Xian-Hua, Huang Feng
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  • Abstract views:  5167
  • PDF Downloads:  301
  • Cited By: 0
Publishing process
  • Received Date:  21 September 2014
  • Accepted Date:  14 January 2015
  • Published Online:  05 June 2015

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