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Radiation effect and degradation mechanism in 65 nm CMOS transistor

Ma Wu-Ying Yao Zhi-Bin He Bao-Ping Wang Zu-Jun Liu Min-Bo Liu Jing Sheng Jiang-Kun Dong Guan-Tao Xue Yuan-Yuan

Citation:

Radiation effect and degradation mechanism in 65 nm CMOS transistor

Ma Wu-Ying, Yao Zhi-Bin, He Bao-Ping, Wang Zu-Jun, Liu Min-Bo, Liu Jing, Sheng Jiang-Kun, Dong Guan-Tao, Xue Yuan-Yuan
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  • Abstract views:  5354
  • PDF Downloads:  112
  • Cited By: 0
Publishing process
  • Received Date:  28 November 2017
  • Accepted Date:  07 February 2018
  • Published Online:  20 July 2019

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