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中国物理学会期刊

关于半导体漂移三极管在饱和区工作时的储存时间问题

CSTR: 32037.14.aps.15.353

ON THE PROBLEMS OF STORAGE TIME OF DRIFT TRANSISTOR OPERATING IN SATURATION REGION

CSTR: 32037.14.aps.15.353
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  • 半导体三极管在饱和区工作时,其等效电路可以用一个三极管及一个由集电极及基极构成的二极管联成的电路表示出来,其中三极管在有源区工作,而二极管在正向偏压下工作。这样的等效电路具有比较明显的物理意义。利用这个电路来求漂移管在一个共基极电路中脉冲工作下的储存时间。解出非平衡少数载流子的连续性方程,求出二极管p-n结附近非平衡少数载流子密度的稳定态分量及暂态分量,从而得到决定储存时间的方程。计算结果表明,储存时间与基极区域及集电极区域中非平衡载流子的寿命及表面复合速度有关。减少寿命及增加表面复合速度就可以减少储存时间。

     

    An equivalent circuit of transistors operating in saturation region is suggested. This circuit contains a transistor operating in active region and a diode biased in forward direction. By using this equivalent circuit, the physical meaning of storage time of transistors may be explained more intuitively. With this, the storage time in drift transistor, Which is common base connected, has been investigated. By solving the continuity equation, the steady state and the transient components of the densities of minority carriers in diode near the p-n-junction is obtained. By setting these two components equal in magnitude and opposite in sign, we get a formula, from which the storage time may be determined. The storage time in some special cases has been calculated. The results show that the storage time depends upon the life time of minorities and the surface recombination velocities both in base region and in collector region. This may be a guide for design a transistor with more short storage time.

     

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