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本文在比较了前人测量ADP晶体压电性能的若干重要方法之后,根据ADP晶体的特点,指出采用动态电容方法并增大串接电容CT和修正静电电容C0,这样虽然使用较差的设备,仍得到了较好的结果。In this paper, a method of measuring the piezoelectric properties of ADP crystal by introducing a dynamic capacitance as well as increasing the capacitance CT in series with the vibrator and correcting the static capacitance C0 is described. The results of measurement are satisfactory.







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