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中国物理学会期刊

ADP晶体压电性能的动态测量

CSTR: 32037.14.aps.22.911

A METHOD OF DYNAMIC MEASUREMENT OF THE PIEZOELECTRIC PROPERTY OF ADP CRYSTAL

CSTR: 32037.14.aps.22.911
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  • 本文在比较了前人测量ADP晶体压电性能的若干重要方法之后,根据ADP晶体的特点,指出采用动态电容方法并增大串接电容CT和修正静电电容C0,这样虽然使用较差的设备,仍得到了较好的结果。

     

    In this paper, a method of measuring the piezoelectric properties of ADP crystal by introducing a dynamic capacitance as well as increasing the capacitance CT in series with the vibrator and correcting the static capacitance C0 is described. The results of measurement are satisfactory.

     

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