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中国物理学会期刊

有简单取向关系的两晶体间电子衍射图相重的规律

CSTR: 32037.14.aps.28.78

ON OVERLAPPING OF ELECTRON DIFFRACTION PATTERNS FROM TWO CRYSTALS WITH A SIMPLE ORIENTATION RELATIONSHIP

CSTR: 32037.14.aps.28.78
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  • 有简单取向关系的两个晶体在倒易空间中有部分倒易点相重。仅由相重倒易点构成的倒易面所对应的电子衍射图必定被基体的衍射斑点所覆盖。给出判定第二相相重电子衍射图晶带轴指数的方法,用此方法考察了立方晶体与孪晶、六角密堆相和ω相等衍射图相重的情况。

     

    For two phases having a simple orientation relationship, some of the reciprocal points coincide in the reciprocal space. The electron diffraction pattern corresponding to the reciprocal planes consisting of common reciprocal points only will superpose on the matrix spots. In this paper, a simple method is established to identify the indices of zone axis which give the second phase electron diffraction pattern superimposed on the matrix spots. The method is applied to examine the cases of the overlapping of cubic matrix pattern with that of the twin crystal, the hexagonal close packed structure, the hexagonal ω-phase, etc.

     

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