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中国物理学会期刊

加热过程中Au—Ge—Ni薄膜的结构变化

CSTR: 32037.14.aps.31.1401

THE STRUCTURAL CHANGES OF Au-Ge-Ni FILMS DURING HEATING

CSTR: 32037.14.aps.31.1401
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  • 用透射电子显微镜对不同热处理后Au-11.4wt%Ge-4.8wt%Ni蒸发薄膜进行了结构分析和形态观察。常温下此膜的结构是过饱和的金固溶体。经300℃以上较长时间(10分钟以上)加热后,膜的结构转变为金固溶体和NiGe化合物。在高压电子显微镜加热台上进行的动态观察显示:升温到约500℃时尺寸近2000埃的圆盘伏NiGe晶粒在两秒内被金固溶体吞并。余下的NiGe晶粒对500℃以上发生的金固溶体薄膜的缩聚过程有阻碍作用。

     

    The structural changes and the morphology of the evaporated Au-11.4 wt%Ge-4.8 wt%Ni films during heating have been studied by TEM. The structure of the as-evaporated film is a supersaturated Au solid solution and after more than 10 minutes anealling above 300℃ the film decomposes into Au solid solution and NiGe compound. In-situ observations in the heating stage of HVEM have revealed that the NiGe grains with size near 2000 A are dissolved into the Au solid solution in 2 seconds during heating to about 500℃. The remaining NiGe grains in the film prevent the balling process of the Au solid solution films occuring above 500℃.

     

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