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中国物理学会期刊

用高压显微光谱系统研究非晶态As2S3的光学折射率随流体静压力变化的规律

CSTR: 32037.14.aps.31.44

STUDYING THE LAWS OF DEPENDENCE OF REFRACTIVE INDICES OF AMORPHOUS As2S3 ON HYDROSTATIC PRESSURE USING HIGH-PRESSURE MICROSPECTROSCOPIC SYSTEM

CSTR: 32037.14.aps.31.44
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  • 用金刚石对顶砧高压显微光谱系统在高达66kbar的流体静压力和光谱波段为400—900nm范围内,用透射光干涉谱法测量了非晶态As2S3(a-As2S3)的光学折射率n与压力p以及波长λ的变化关系。a-As2S3的折射率对压力极为敏感,在波长为650nm,压力从1bar变到66kbar时,它增加35%。在计算机上用最小二乘法对实验点进行拟合的结果得到:对某一波长λ来说,遵循n(P)=n(0)+Ap+Bp2的非线性关系。其中n(p)和n(0)是p压和常压下的折射率,A和B是与波长有关的系数,文中给出了A和B的具体参数。这个关系与Weinstein和Galkiewicz等人公布的n(p)和p之间遵循线性关系不同。

     

    The pressure and wavelength dependence of refractive indices of amorphous As2S3 have been studied by means of observing transmission light interference spectrum under room temperature with the high-pressure microspectroscopic system in conjunction with the gasketed diamond anvil cell, in which methanol-ethanol mixture was used as pressure liquid with hydrostatic pressure up to 66kbar and wavelength between 400-900 nm. The pressure was monitored by ruby R-line shift. Amorphous As2S3 thin film samples a few micrometers in thickness were prepared by vacuum evaporation. Under our experimental conditions, neither the light of 441.6 nm He-Cd laser used for excitation of the ruby gauge, nor that of the Br-W lamp for measurement of light transmission, showed any detectable influence on the optical properties of the sample.By observing the interference maxima at energies below the absorption threshold and using the results of. Gerlich et al. of the pressure dependence of volume of a-As2S3, the pressure dependence of refractive index between 500-850 nm have been determined. The refractive index of amorphous As2S3 is significantly pressure-sensitive, increasing by 35% at 650 nm with pressure change of 66 kbar. Analysis of experimental data by least-square method on the computer gives the coefficients of the nonlinear formula n(p)=n(0)+Ap+Bp2, where n(p) and n(0) are refractive indices at pressure p and 1 bar, respectivelly; coefficients A and B are relative to wavelength, for example A=9.62×10-3 kbar-1,B=2.07×10-3 kbar-2, for wavelength) λ = 800nm and other values were given in the paper. This relationship is different from the results of Weinstein et al. and Galkiewicz et al., where linear relationship between n and p at fixed wavelength in infra-red regime was reported. The difference, however, may be attributed to the different method of sample preparation etc.

     

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