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中国物理学会期刊

Al/GaAs界面反应的XPS研究

CSTR: 32037.14.aps.32.1328

AN INVESTIGATION OF Al/GaAs INTERFACE REACTION BY XPS

CSTR: 32037.14.aps.32.1328
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  • 用XPS研究了清洁无序GaAs表面沉积超薄Al膜后的界面反应,结果表明,原沉积于GaAs表面的Al能进入GaAs衬底取代Ga形成AlAs,而通过Al-Ga替位反应释放出来的Ga则残留在衬底表面,提出了Ga/AlAs+GaAs/GaAs三层结构模型。

     

    After deposition of a layer of super-thin A film on a clean disordered GaAs surface, the Al/GaAs interface reaction is studied by XPS. The results show that the Al atom can penetrate into GaAs substrate to form AlAs with freed Ga left on GaAs substrate surface by Al-Ga replacement reaction. A Ga/AlAs + GaAs/GaAs three layer model is proposed.

     

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