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木文测量了光子能量为21.2eV,40.8eV和1486.6eV的光电子谱,得到了关于GaAs(110)解理面上银膜的价带能谱新数据,并得到金膜价带能谱的补充数据,蒸发的银膜和金膜的厚度范围为0.l?到1000?,实验上发现并讨论了下面的现象:GaAs(110)面上金膜和银膜的紫外价带光电子谱的强度与膜厚的关系曲线中出现极大峰。New data about photoemission spectra of silver on GaAs (110) cleavage surface have been found by measurement at hv=21.2eV, 40.8eV, and 1486.6eV. Some additional data of gold on GaAs are also obtained. The thickness of evaporated Ag and Au films used for measurement ranged from 0.1? to 1000?.A maximum in the functional relation between the intensity of UPS valence spectra and the thickness of film has been noted and discussed.
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中国物理学会期刊
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