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中国物理学会期刊

四川白云母薄膜的结构特性

CSTR: 32037.14.aps.32.1489

STRUCTURAL CHARACTERISTICS OF THIN FILMS OF WHITE MICA

CSTR: 32037.14.aps.32.1489
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  • 本文介绍了使用透射式电子显微镜和扫描电子显微镜研究厚度约为300—1000?的四川甲级白云母薄膜的结构和成分组成,结论是这种白云母薄膜具有相当完善的单晶结构特性,没有检测到存在什么杂质,但在某些区域存在图2—4所表明的缺陷。云母薄膜可以作为基底材料,在其上沉积或生长具有较大晶粒的其他薄膜。

     

    In this work, the structure and chemical composition of thin films of white mica found in Si-Chuan Province are studied by transmission electron microscopy and scanning electron microscopy. The. thickness is in the range of 300-1000?. It is concluded that the sample is nearly perfectly crystalline and contains no detectable impurities, however some defects are discovered in certain regions as shown in the text (Fig. 2-4).Thin mica film can be used as a substrate on which other thin film can deposit or grow into large crystalline grains.

     

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