搜索

x
中国物理学会期刊
高级检索

用XPS研究GD-a-SixC1-x:H膜中等离子体激元的特征

物理学报, 1983, 32(6): 803-807.
DOI: 10.7498/aps.32.803
CSTR: 32037.14.aps.32.803

BEHAVIOR OF PLASMONS IN GD-a-SixC1-x:H SAMPLES STUDIED BY XPS

Acta Phys. Sin., 1983, 32(6): 803-807.
DOI: 10.7498/aps.32.803
CSTR: 32037.14.aps.32.803
PDF
导出引用

  • 摘要

    对于GD-a-SixC1-x:H薄膜进行了XPS分析,得到了一些与Katayama相类似的结果。本文将给出GD-a-SixC1-x:H样品的价电子等离子激元(Plasmon)的频率ωp以及原子浓度(Nsi+NC+NH)随样品含碳量的变化,Si2p和C1s芯电子结合能随含碳量变化的化学移动,并对这些结果进行了初步的分析。

     

    Abstract

    XPS analyses of the GD-a-SixC1-x:H samples have been made, the results are similar to those of katayama. In this paper, the chemical shifts of Si2p and Cls levels, the observed valence-electron plasmon energy hωp and the atomic density of our samples with various alloy composition x are presented. The results are discussed preliminarily.

     

      作者及机构信息

      Authors and contacts

      参考文献

    目录

    /

    返回文章
    返回