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本文计算了高密度的二维电子体系的边缘能(将二维体系沿某一直线解离成两片时,形成单位长度新边缘所需要的能量)。结果发现,当rss(c)(约0.415)时,边缘能变负,从而表明在高密度下,二维电子气的基态有可能发生不稳。我们分别讨论了二维非束缚的电子气和束缚的电子气基态的稳定性,并在一个简化的模型下给出了束缚的电子气基态稳定性的判据。The edge energy of the 2-dimensional electron gas with high density is calculated, here the edge energy implies the energy which is needed to form a unit length of new edge when a 2-dimensional infinite homogeneous electron system is cleft into two pieces of semi-infinite electron systems. It is found that, for rss(c)≈0.415, the edge energy becomes negative, indicating that at high enough density the ground state of the 2-dimensional electron gas can be unstable. The stability of the ground state of the bound and unbound 2-dimensional electron gas is discussed and a criterion for the ground-state stability of the bound 2-dimensional electron gas is obtained for a simplified model.







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