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中国物理学会期刊

半导体深能级瞬态谱中多子脉冲下的少子陷阱响应

CSTR: 32037.14.aps.34.1559

RESPONSE OF THE MINORITY CARRIER IN THE SEMICONDUCTORS DLTS UNDER MAJORITY CARRIER PULSE CONDITION

CSTR: 32037.14.aps.34.1559
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  • 在一个Si中掺Aup+n结的多子脉冲下深能级瞬态谱(DLTS)中,发现了一个少子峰信号。给出了这一现象的主要实验结果,并做了系统的物理分析。这是p+n结中高掺杂一侧的自由少数载流子尾在自建势所张开的空间电荷区中被少子陷阱俘获后,再发射的结果。

     

    A minority earlier peak is discovered in the DLTS of a silicon p+n junction doped with gold under majority carrier pulse condition. The major experimental results and systematic physical analyses is presented. We show, that the minority carrier peak is a result due to the capture of a free minority carrier tail from the side of the heavily doped region of the p+n junction at the mincrirty carrier traps in the space charge region, which is built by the built-in potential, and its subsequent emission.

     

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