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中国物理学会期刊

平面阻塞效应测量Ep=1565keV时27Al(p,α)24Mg共振反应寿命

CSTR: 32037.14.aps.36.1564

THE LIFETIME MEASUREMENT OF THE 27Al(p,a)24Mg RESONANT REACTION AT ∑p = 1565 keV BY THE PLANAR BLOCKING EFFECT

CSTR: 32037.14.aps.36.1564
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  • 采用(111)面阻塞效应测量了Ep=1565keV共振时27Al(p,α)24Mg核反应寿命。用解析方法分析实验数据。测到的核寿命τ=17.9-4.0+4.4as,与轴阻塞效应测量结果和文献给出的结果在误差范围内一致。测量了Ep=1183.4keV时(111)面的α粒子的阻塞分布,并与理论计算作了比较。

     

    The (111) planar blocking effect is used to measure the lifetime of the 27Al(p, α)24Mg resonant reaction at Ep=1565keV and analytical methods is used to deduce the lifetime. The (111) planar blocking dip of the Ep=1183.4 keV resonance in the 27Al(p,α)24Mg reaction is also measured and compared with that calculated by theoretical calculations. The obtained lifetime τ=17.9-4.0+4.4 as is in good agreement with that obtained by the〈110〉axial blocking effect and that reported in the literature within the range of errors.

     

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