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用NaI(Tl)晶体闪烁探测器和金硅面垒型半导体探测器,在HT-6B托卡马克装置上对X射线起伏进行了相关测量。观测了硬X射线发射和起伏锯齿波形。实验证实:在2—25kHz频区内的硬X射线起伏也是MHD扰动所致。Nal(Tl) scintillation detector and Si(Au) surface barrier semiconductor detector are used to measure X-ray fluctuations in the HT-6B Tokamak device. The hard X-ray emission and sawtooth oscillations have been observed. The experiment shows hard X-ray fluctuations are due to MHD disturbances in the frequency range of 2-25 kHz.
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中国物理学会期刊
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