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中国物理学会期刊

金属玻璃(Cu1-xNix)33Zr67合金的低温电阻率

CSTR: 32037.14.aps.37.1167

LOW TEMPERATURE RESISTIVITY OF METALLIC GLASSES (Cu1-xNix)33 Zr67

CSTR: 32037.14.aps.37.1167
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  • 本文研究了金属玻璃(Cu1-xNix)33Zr67合金的低温电阻输运特性。在较宽的温区(2—273K)测试了电阻率,测量结果符合Mooij判据。样品电阻率随温度的变化行为与双能级隧道模型符合较好。

     

    Low temperature electrical transport properties of metallic glasses (Cu1-xNix)33Zr67 series has been investigated in the present work. In the wide temperature range of 2-273 K, the resistivity is in accordance with Mooij correlation. The theoretical results in the two level tunnelling model agree with the experimental data (TD) satisfactorily.

     

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