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中国物理学会期刊

用HREELS,XPS,LEED研究Al-GaAs(100)(4×1)界面反应

CSTR: 32037.14.aps.37.1882

THE Al-GaAs(100)(4×1) INTERFACIAL REACTION STUDIED BY HREELS, XPS AND LEED

CSTR: 32037.14.aps.37.1882
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  • 高分辨率电子能量损失谱(HRFELS)能直接判定Al-GaAS(100)界面反应的生成物。本文结合X射线光电子能谱(XPS)的测量,采用HREELS来测量界面的禁带宽度,研究了Al-GaAs(100)(4×1)界面的形成过程。结果判定了室温下Al-GaAs(100)界面生成的为AlAs。而退火后,界面上生成AlCaAs合金。实验中还用低能电子衍射(LEED)观察了室温下Al在GaAs(100)(4×1)面上的淀积过程,发现随着Al淀积量的增加,表面是从无序到有序转化的。

     

    In combining with X-ray photoelectron spectroscopy (XPS) measurement, the high resolution electron energy loss spectroscopy (HREELS) is used to investigate the evolution of energy gap width during the formation of Al-GaAs(l00) Interface. It is found that at room temperature, the product of Al-GaAs(100) interface reaction is AlAs. And AlGaAs alloy is formed after an annealing treatment. Low energy electron diffraction (LEED) is used also to study the deposition process of Al on GaAs(100)(4×1) surface. The deposited surface is disordered at the beginning and become ordered with Al deposition amount increasing.

     

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