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本文是文献1的续篇。对于原A,B,C三种样品在已测得Deff,ρ,M,Re和(E/V)的基础上,又分别测出了抽出型、插入型和孪生层错几率α′,α″和β以及层错能γ,真正晶块大小D0。The probabilities α′,α″ and β of intrinsic, extrinsic and twin stacking faults were measured respectively based on previous determination of Deff, ρ, M, Re and of samples A, B, C. The stacking fault energy γ and true subgrain size D0 were also obtained.







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