Defects in photorefractive BaTiO3 crystal, obtained by the top seed solution growth method, have been studied by analytical electron microscopy. Thin foils containing inclusions for transmission electron micrsocopy (TEM) were prepared by ion milling the mechanically polished thin sections. Combining diffraction and electron energy loss spectroscopy in a TEM, the inclusions were identified as amorphous Ba-Ti-O and Ba6Ti17O40. Other microdefects which are only visible in the TEM have been identified as crystalline precipitates.