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钨磷酸盐非晶铜离子导体的结构与电性能

物理学报, 1990, 39(5): 793-801.
DOI: 10.7498/aps.39.793
CSTR: 32037.14.aps.39.793

STUDY ON THE STRUCTURE AND ELECTRIAL PROPERTIES OF THE COPPER-TUNGSTEN-PHOSPHATIC NON-CRYS- TALLINE IONIC CONDUCTORS

Acta Phys. Sin., 1990, 39(5): 793-801.
DOI: 10.7498/aps.39.793
CSTR: 32037.14.aps.39.793
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  • 摘要

    本文给出了当CuI含量为30mol%时CuI-Cu2O-WO3-P2O5系统的玻璃形成区。测量了样品的交流电导率,得出了电导率随WO3含量变化规律。采用红外光谱、阻抗谱、径向分布函数(RDF)和扫描电子显微镜(SEM)等测试手段研究了该系统材料的结构,讨论了电学性能与结构的相互关系。

     

    Abstract

    The glass forming-region of the Cul-Cu2O-WO3-P2O3 system with Cul content being 30 mol% is given. The ac conductivity of the specimens is measured. The relation between conductivity and WO3 content is determined. The structure of this system is studied by IR spectra, complex impedance diagrams, RDF and SEM. The relation between the electrial properties and the structure is discussed.

     

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