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卤族离子对银表面-分子系统中的表面增强Raman光谱信号的影响

物理学报, 1992, 41(9): 1542-1546.
DOI: 10.7498/aps.41.1542
CSTR: 32037.14.aps.41.1542

INFLUENCE OF HALOGEN FAMILY ANIONS ON SERS SIGNAL IN Ag SURFACE-MOLECULE SYSTEM

Acta Phys. Sin., 1992, 41(9): 1542-1546.
DOI: 10.7498/aps.41.1542
CSTR: 32037.14.aps.41.1542
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  • 摘要

    本文研究了多种卤族元素对表面增强Raman光谱(SERS)信号的影响,给出SERS强度随不同卤离子浓度的变化关系及Raman特征峰强度反转现象,并对其机理进行了初步的分析。

     

    Abstract

    The influence of halogen family elements on the SERS signal was studied. The relation-shap between the SERS intensity and the concentration of halide and reversal phenomena of intensity of Raman peaks were discovered. Finally, some explanations were givea.

     

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