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中国物理学会期刊

金刚石膜与Si衬底间过渡层的结构稳定性

CSTR: 32037.14.aps.42.309

A STUDY ON STRUCTURAL STABILITY OF BUFFER LAYER BETWEEN SILICON SUBSTRATE AND DIAMOND FILM

CSTR: 32037.14.aps.42.309
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  • 用热丝化学汽相沉积(HFCVD)技术在si(111)和si(100)衬底上获得了高质量的金刚石膜。并随着生长时间的增加,利用X射线光电子能谱(XPS)和俄歇电子能谱(AES)研究了过渡层中碳硅化合物组分的变化及其作用。同时提出渐变过渡层:Si/Si1-xCx/SiC/SiyC1-y/金刚石模型。当组分参量x与y在0.1—0.25之间取值时,用Keating方法给出了系统的稳定结构。

     

    High-quality diamond films are grown on Si substrate by hot filament chemcial vapor de-position (HFCVD). With increase of growth time, pure carbon species and mixtures of them are also identified by X-ray photoelectroscopy (XPS) and auger electron spectroscopy (AES). To describe the buffer layers, a gradient model is proposed as Silicon/Si1-xCx/SiC/SiyC1-y/ Diamond. Within the range of 0.10 

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