The effect of electrode materials on the structure and electric properties of ferroelectric PLZT(7.5/65/35) ceramic thin films has been investigated. It has been shown that, for a certain thickness of the Pt layer, the thickness of the Ti layer has a dominant effect on the structure and electric properties of the ferroele-ctric thin films. When the Ti layer was too thick or too thin, PUT thin films had undesireable crystalline structure. However, with appropriate thickness of the Ti layer, ferroelectric thin films of good microstructure and electric properties be obtained, with typical remanent polarization 27.8μ Ｃ·ｃｍ-2，and coercive field 65.1kV·ｃｍ-1，respectively.