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使用分子束外延方法生长了一种新的基于Siδ掺杂的AlxGa1-xAs/GaAs异质结,测量了0.3-30K低温下异质结处二维电子气的横向磁阻、迁移率和Hall电阻,磁阻的Shubni-kov-de Hass(SdH)振荡非常明显。对振荡曲线作快速Fourier变换分析,获得了二维电子气中每一子能带上占据的电子数密度和有效质量(m0*/m0=0.073,m1*A new type of AlxGa1-xAs/GaAs beterojunction based on Si δ-doping has been fabricated by MBE method. We measured the magnetoresistances, mobility and Hall resistance of the 2-D electron gas at the junction in a transvers magnetic field from 0.3 to 30K. Using Fourier-transform analysis, the distribution of electrons and their effective masses for each subband are determined. which are m0*/m0=0.073,m1*/m0=0.068. With the decreasing of temperature,the electrons in each subband increase continuously. We observed abnormal peaks in magnetoresistance wben magnetic field was scanned from 0 to 7T at 0.3K.







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