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中国物理学会期刊

无规分形衬底上银膜逾渗系统的交流特性

CSTR: 32037.14.aps.43.651

AC CHARACTERISTICS OF A THIN Ag FILM PERCOLATION SYSTEM DEPOSITED ON A STATISTICAL FRACTAL SUBSTRATE

CSTR: 32037.14.aps.43.651
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  • 通过对沉积在具有无规自相似结构的α-Al2O3断裂面上的银薄膜逾渗系统交流特性的测量,证明了在逾渗阈值pc附近这一系统的交流电导率和介电常数满足指数临界规律和普适标度关系。还给出了这种逾渗系统的电容与直流电阻的关系,并对其意义作了讨论。

     

    Ac characteristics of a thin Ag film percolation system deposited on a broken surface of α-Al2O3 ceramics are measured. We prove that the ac conductivity and ac dielectric constant obey the power law and the general scaling relation near the percolation threshold. The ac capacitance data as a function of the dc resistivity are obtained and its role is discussed.

     

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