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利用二次离子质谱(SIMS)技术,分析了Ag和A1与YBa_2Cu_3O_(7-x)(YBCO)超导薄膜接触界面互扩散.结果显示,它们有不同的互扩散特征.利用SIMS的分析结果,可以很好地理解经高温热处理后,Ag/YBCO和A1/YBCO样品具有不同界面电学性质的原因.Different interdiffusion characteristics between the Ag/YBCO and Al/YBCO contact interfaces have been revealed by SIMS studies. The different electrical properties of Ag/YBCO and Al/YBCO interfaces after high temperature treatment are well understood by SIMS results.







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