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中国物理学会期刊

Bi12GeO20晶体的位错蚀斑与对称群

CSTR: 32037.14.aps.45.1366

THE ETCH PITS OF DISLOCATIONS AND SYMMETRY GROUP IN Bi12GeO20 CRYSTAL

CSTR: 32037.14.aps.45.1366
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  • 用化学浸蚀法系统的研究了Bi12GeO20晶体100,100,111等晶面独特浸蚀斑规律并用对称群理论进行分析.理论预示的蚀斑形态与实验结果符合很好.显示位错蚀斑是由112晶面组成,即晶体的惯态面为112.

     

    The etch pits of dislocations in Bi12GeO20 crystal at (100), (110) and (111) planes have been studied by means of chemical etching. The pattern of etch pits are very special compared with the common cubic system crystal, and we have analyzed it with theory of symmetry group. The patterns of etch pits by theoretical analysis are in conformity with the experiment. It shows that the pettern of etch pits of dislocations consists of 112 planes. It is clear that the habitual plane of crystal of Bi12GeO20 crystal is 112 plane.

     

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