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运用量子电容谱测量技术,在窄禁带半导体材料InSb和HgCdTe价带和导带中分别发现了两个共振缺陷态.根据建立的实验模型研究了这些共振缺陷态的特性By using a newly developed measuring technique,i.e. the quantum capacitance spectroscopy,resonant defect states were observed in the valence band and the conduction band of narrow gap semiconductor InSb and HgCdTe materials. On the basis of a developed experimental model,the properties of the resonant defect states are investigated.







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