搜索

x
中国物理学会期刊

窄禁带半导体材料中共振缺陷态测量

CSTR: 32037.14.aps.46.964

MEASUREMENT OF RESONANT DEFECT STATES IN NARROW GAP SEMICONDUCTORS

CSTR: 32037.14.aps.46.964
PDF
导出引用
  • 运用量子电容谱测量技术,在窄禁带半导体材料InSb和HgCdTe价带和导带中分别发现了两个共振缺陷态.根据建立的实验模型研究了这些共振缺陷态的特性

     

    By using a newly developed measuring technique,i.e. the quantum capacitance spectroscopy,resonant defect states were observed in the valence band and the conduction band of narrow gap semiconductor InSb and HgCdTe materials. On the basis of a developed experimental model,the properties of the resonant defect states are investigated.

     

    目录

    /

    返回文章
    返回