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中国物理学会期刊

SiOx∶H(0<x<2)薄膜光致发光的退火行为研究

CSTR: 32037.14.aps.47.1033

ANNEALING BEHAVIORS OF PHOTOLUMINESCENCE FROM SiOx∶H FILMS

CSTR: 32037.14.aps.47.1033
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  • 采用退火后处理的方法,使SiOx∶H(0<x<2)形成纳米硅与二氧化硅的镶嵌结构.利用红外透射谱、Raman谱和光致发光谱,系统地研究了不同退火温度对薄膜微结构及室温光致发光谱的影响.发现发光谱均由两个Gauss线组成,其中主峰随着退火温度的升高而红移,而位于835nm的伴峰不变.指出退火前在720—610nm的波长范围内强的主峰可能来源于膜中的非晶硅原子团,随退火温度的升高主峰的红移是由于非晶硅原子团的长大.而伴峰可能来自硅过剩或氧欠缺引入的某种发光缺陷.1170℃退火后在850n

     

    The nanocrystalline silicon embedded in silicon dioxide has been successfully prepared by post heat treatment for SiOx∶H.We have found that each strong photoluminescence spectrum from a-SiOx∶H consists of two Gaussian components.One is a main broad peak which redshifts with the increase of annealing temperature and the other is a shoulder remaining at about 835 nm.In conjunction with infrared and micro-Raman spectra,the possible origins of the two bands are discussed.The peaks around 850 nm after annealing at 1170℃ are associated with the precipitation of nanocrystalline silicon,and this supports the quantum confinement effect.

     

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