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中国物理学会期刊

层状钙钛矿结构铁电薄膜SrBi2Ta2O9的掺杂改性研究

CSTR: 32037.14.aps.47.1222

DOPING CHARACTERIZATION STUDIES OF LAYERED PEROVSKITE SrBi2Ta2O9 FERROELECTRIC THIN FILMS

CSTR: 32037.14.aps.47.1222
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  • 研究了Nb掺杂对层状钙钛矿结构铁电薄膜SrBi2Ta2O9(SBT)的改性,分析了其改性机理.利用光声光谱技术对不同含量Nb掺杂SBT薄膜的可见光吸收进行了分析.结果表明掺杂SBT薄膜在580nm处的吸收带随Nb含量的增加发生红移,这暗示掺杂SBT薄膜的能隙与Nb含量有关.对掺杂SBT薄膜的铁电性质研究表明,薄膜的剩余极化值依赖于薄膜中的Nb含量,这与薄膜存在相界有关.

     

    The characterization of Nb-doped layered perovskite SrBi2Ta2O9 was studied.The mechanism of modification of properties was analyzed.Photoacoustic spectroscopy has been used to study the light absorption of SrBi2Ta2O9 with various Nb contents.The results show that the absorption band at 580nm in the photoacoustic spectroscopy exhibits a red shift with increasing niobium content.The remanent polarization of Nb-doped SrBi2Ta2O9 films depends on the concentration ratio of Ta/Nb.The remanent polarization of the films arose an maximum at the area of Ta/Nb≈1.This may be related to the existence of morphotropic phase boundary.

     

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