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中国物理学会期刊

有机复合薄膜中超高密度信息存储研究

CSTR: 32037.14.aps.47.1229

STUDY OF ULTRAHIGH DENSITY DATA STORAGE ON ORGANIC-COMPLEX THIN FILMS

CSTR: 32037.14.aps.47.1229
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  • 利用大气中工作的扫描隧道显微镜,在真空蒸发方法制备的有机复合薄膜上,通过施加电压脉冲法做出了信息点阵,信息点大小为1.3nm.电流-电压特性表明:存储区表现为导体特性,非存储区为绝缘体特性.信息存储实验表明:相邻两个信息记录点的间距可小于2nm,信息存储密度可高达2.5×1013bit/cm2.对信息存储的机制进行了初步分析.

     

    Crystalline organic complex thin films have been performed by vacuum evaporation method on HOPG substrates.Using Scanning Tunneling Microscope storage,array has been made on the film by applying voltage pulses between the tip and the substrate.The recording marks are 1.3nm in diameter.Voltage-current characterization shows that the recorded region has a conductor behavior while the unrecorded regions shows an insulator behavior.It is confirmed from experiments that the distance between two recording marks can be as short as 2nm,which corresponds to the storage density of 2.5×1013bit/cm2.The mechanism about the recording is briefly discussed.

     

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