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在GaAs(001)衬底上,用分子束外延生长Sb(111)薄膜,用反射式高能电子衍射仪原位监控生长过程,用透射电子显微镜观察薄膜结构,并用van der Pauw方法测量了电阻率随生长温度的变化,观察到Sb薄膜半金属/半导体转变及其量子尺寸效应.Thin film of Sb(111) was grown on GaAs(001) substrate by molecular beam epitaxy. The growth process of the film was characterized in-situ by reflective high energy electron diffraction and the film structure was investigated by transmission electron microscrope. The resistivity as a function of growth temperature was measured by van de Pauw method. We have observed the quantum size effect in Sb film grown on GaAs substrate.







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