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中国物理学会期刊

电解有机溶液法制备CNx薄膜

CSTR: 32037.14.aps.48.1292

DEPOSITION OF CNx THIN FILMS BY ELECTROLYSIS OF ORGANIC SOLUTION

CSTR: 32037.14.aps.48.1292
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  • 在60℃和常压下,电解甲醇和脲的混合溶液在硅基片上沉积CNx薄膜.傅里叶红外和Raman测试表明,所得薄膜是非晶态的,碳和氮主要是以C—N,C—C,C=C和C=N的形式成键,有少量的碳和氮以C≡N的形式成键.X射线光电子能谱测试表明,氮是以SP2和SP3杂化形式与碳化学成键来成膜的.测试结果表明通过液相沉积法所得CNx薄膜与汽相沉积法所得CNx薄膜的结构比较接近.

     

    By electrolysis of the methanol and urea solutions CNx thin films have been synthesized on silicon substrates at atmospheric pressure and low tempreture (60℃). The FTIR and Raman measurements show that the films are amorphous carbon network with the staples of many C—N, C—C, C=C and C=N bonds and a small portion of C≡N bonds. The XPS measurements indicate that nitrogen atoms is chemically bonded to carbon atoms through hybridized SP2 and SP3 configurations. The structures of the amorphous CNx thin films deposited by this method are every similar to those by vapor depositions.

     

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