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用透射电子显微镜观察了Si(113)衬底上由固态源分子束外延生长的自组织量子点的形貌,测量了其原生及退火后低温下的光荧光谱.对所得结果进行了分析.Morphology of self-assembled GeSi quantum dot grown on Si(113) by Si molecular beam epitaxy has been studied by transmission electron microscopy and atomic force microscopy.Photoluminescence from the as-grown sample and annealed sample was studied.The res







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