In this paper, it is reported that the Sn ions (200keV, 6×1016 and 1×1017ion/cm2) were implanted at room temperature into specimens of lead telluride. By making use of electric and thermal measurements, X-ray diffraction and X-ray photoelectron spectroscopy, we have studied the effects of implantation on the thermoelectric properties and the structure of implanted layer of lead telluride.