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中国物理学会期刊

随机散射屏的原子力显微镜形貌分析及其光散射特性

CSTR: 32037.14.aps.49.1260

MORPHOLOGICAL ANALYSIS BY ATOMIC FORCE MICROSCOPE AND LIGHT SCATTERING STUDY FOR RANDOM SCATTERING SCREENS

CSTR: 32037.14.aps.49.1260
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  • 用原子力显微镜对三种不同粗糙度的随机散射屏的表面形貌进行了测量分析,发现它们在短程范围内具有明显的分形特征.对于粗糙度较大和较小的散射屏,分形特征分别以无规则的 高度调制和无特征大小的小颗粒的形式存在.用自仿射分形表面模型对散射屏的统计特性进 行了描述和拟合.光散射测量发现,散射光强在远轴区域按负幂函数下降,理论分析证明这 源于表面的分形结构;在近轴区域有散射亮环存在,用自仿射分形表面模型尚不能给出理论解释.

     

    The morphology of random screens with different surface roughness is studied with atomic force microscope and it is found that their height distributions have very obvious fractal characteristics in short range regions.For screens with larger and smaller roughness,the fractals exist in the forms of random height fluctuations and small grains without characteristic size respectively.The self-affine fractal surface model is introduced to the quantitative descriptions of randomscreens.The light scattering measurements show that:(1)the scattered intensity in off-axis region descends in negative power functions,and the theoretical analy sis based on self-affine fractal model indicates that it originates from the sho rt-range fractal of the screens;and(2)there is a halo ring in the scattered fiel ds in the paraxial region .This phenomenon cannot yet be explained on the basis of the self-affine fractal model.

     

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