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中国物理学会期刊

光照下高电子迁移率晶体管特性分析

CSTR: 32037.14.aps.49.1394

ANALYSIS OF PROPERTIES OF HIGH-ELECTRON-MOBILITY-TRANSISTOR UNDER OPTICAL ILLUMI NATION

CSTR: 32037.14.aps.49.1394
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  • 以光照下耗尽型AlGaAs/GaAs高电子迁移率晶体管为例,考虑了光生载流子对半导体内电荷密度的影响和光压效应,采用器件的电荷控制模型,分析了光照对器件夹断电压、二维电子气浓度、I-V特性以及跨导的影响.与无光照的情况相比较,夹断电压变小,二维电子气浓度 增大,从而提高了器件的电流增益,增大了跨导.

     

    We studied the dynamical behaviors of the depletion-mode AlGaAs/GaAs high-electr on-mobility transistor under optical illumination. The photovoltage effect and t he photogenerated carriers contribution to the space charge concentration were t aken into account. The pinch-off voltage, the sheet concentration of two-dimensi onal electron gas (2-DEG) located at the interface of the heterojunction, the I- V characteristic curve, and the transconductance were investigated by using the charge-controlling model. We found that the pinch-off voltage was lowered and th e sheet concentration of 2-DEG was increased because of the optical illumination , which, in turn, resulted in an increase in the current gain and the transcondu ctance of the device.

     

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