搜索

x
中国物理学会期刊

纳米硅薄膜的低温电输运机制

CSTR: 32037.14.aps.49.1798

THE TRANSPORT MECHANISM IN NANOCRYSTALLINE SILICON FILMS AT LOW TEMPERATURE

CSTR: 32037.14.aps.49.1798
PDF
导出引用
  • 在很宽的温度范围(500—20K)研究了本征和不同掺磷浓度的纳米硅薄膜的电输运现象.发现 原先的异质结量子点隧穿(HQD)模型能很好地解释薄膜在高温下(500—200K)的电导曲线,但 明显偏离低温下的实验值.低温电导(100—20K)具有单一的激活能W,并与kBT值 大小相当(W~1—3kBT),呈现出Hopping电导的特征.对HQD模型做了修正,认为 纳米硅同时存在两种输运机制:热激发辅助的电子隧穿和费米能级附近定域态之间的Hoppin g电导.高温时(T

     

    In a wide temperature range (500—20 K), we studied the electrical transport mechanism in intrinsic and P-doped nanocrystalline silicon films. We find that the HQD model successfully explains the conductivity at high temperatures (500—200K ), but fails at temperature below 200K. Single activation energy W was found in the low temperature range (100—20K), which is approximately equal to the value of kBT(W~1—3kBT).It is in good agreement with the charac teristics of hopping conduction in amorphous semiconductor, In this paper we mod ified the HQD model. We consider two distinct transport mechanisms, thermal-assi sted tunneling and electrons hopping through the local states near the Fermi lev el exist simultaneously. At high temperature tunneling transport is the main pro cess. At low temperature transport is governed by electron hopping. On this basi s, a complete analytic function of the conductivity is proposed. The function su ccessfully explains the conductivity of intrinsic and P-doped nanocrystalline si licon films in the whole temperature range.

     

    目录

    /

    返回文章
    返回