We have studied the semiconducting property of the Y1Ba2Cu 3O7-δ(δ≥05, abbreviated YBCO) thin film which is depo sited on Si substrate and the characteristics of the bolometer using the film to detect IR radiation. We measured TCR merit and Hall coefficient and analyzed th e microstructure and the responsive characteristics of the YBCO semiconducting t hin film through XRD and Raman spectrum. We believe that the thin film is a new sensing material which can be applied to uncooled infrared focal plane bolometers.